X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites

dc.contributor.advisor	Mitchell, Roger H.
dc.contributor.author	Ross, Kirk Campbell
dc.date.accessioned	2017-06-05T19:24:35Z
dc.date.available	2017-06-05T19:24:35Z
dc.date.created	2000
dc.date.issued	2000
dc.identifier.uri	http://knowledgecommons.lakeheadu.ca/handle/2453/1765
dc.description.abstract	This study presents an X-ray diffraction analysis and Rietveld structural refinement of selected synthetic fluoroperovskite-type compounds including the Na1-xKxMgF3 solid solution series in addition to synthetic analogues of cryolite (Na2NaAlF6) and simmonsite (Na2LiAlF6). The Na1-xKxMgF3 solid solution series is comprised of three structurally distinct perovskite phases. In order of increasing potassium they are; orthorhombic (Pbnm, a = 5.3609(1), b = 5.4862(1), c = 7.6661(1), Z = 4) in the x = 0 - 0.35 compositional range, tetragonal (P4/mbm, a = 5.444(3), c = 3.9217(3), Z = 2) in the x = 0.40 ~ 0.46 compositional range and cubic (see document)
dc.language.iso	en_US
dc.subject	X-rays Diffraction Data processing
dc.subject	Rietveld method
dc.subject	X-ray crystallography Technique
dc.title	X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites
dc.type	Thesis
etd.degree.name	Master of Science
etd.degree.level	Master
etd.degree.discipline	Geology
etd.degree.grantor	Lakehead University